Serveur d'exploration sur le cadmium en France - Exploration (Accueil)

Index « Auteurs » - entrée « P. Siffert »
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List of bibliographic references indexed by P. Siffert

Number of relevant bibliographic references: 22.
[0-20] [0 - 20][0 - 22][20-21][20-40]
Ident.Authors (with country if any)Title
000237 (2001) A. Zumbiehl [France] ; M. Hage-Ali [France] ; P. Fougeres [France] ; J.M. Koebel [France] ; R. Regal [France] ; C. Rit [France] ; M. Ayoub [France] ; P. Siffert [France]Modelling and 3D optimisation of CdTe pixels detector array geometry – Extension to small pixels
000458 (1999) Ch. Scheiber [France] ; B. Eclancher [France] ; J. Chambron [France] ; V. Prat [France] ; A. Kazandjan [France] ; A. Jahnke [Allemagne] ; R. Matz [Allemagne] ; S. Thomas [Royaume-Uni] ; S. Warren [Royaume-Uni] ; M. Hage-Hali [France] ; R. Regal [France] ; P. Siffert [France] ; M. Karman [Hongrie]Heart imaging by cadmium telluride gamma camera
000702 (1996) M. Hage-Ali [France] ; J.M Koebel [France] ; R. Régal [France] ; P. Siffert [France] ; V. Prat [France] ; H. Simon [France]Cadmium telluride small probes for gamma-ray spectrometry
000703 (1996) M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France] ; V. Prat [France] ; H. Simon [France]Cadmium telluride (CdTe) miniature probes for nuclear fuel gamma-ray spectrometry
000791 (1995) J.Y. Moisan [France] ; P. Gravey [France] ; G. Martel [France] ; N. Wolffer [France] ; A. Aoudia [France] ; Y. Marfaing [France] ; R. Triboulet [France] ; M.C. Busch [France] ; M. Hadj-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]Behaviour of hole and electron dominated photorefractive CdTe: V crystals under external continuous or periodic electric field
000847 (1994) P. Wurm [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]Study of the photodecay in CdTe X-ray detectors
000A37 (1991) M. Hage-Ali [France] ; B. Yaacoub [France] ; S. Mergui [France] ; M. Samimi [France] ; B. Biglari [France] ; P. Siffert [France]Microscopic defect level characterization of semi-insulating compound semiconductors by TSC and PICTS
000B36 (1989) B. Biglari [France] ; M. Samimi [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]The interaction of copper with structural defects in THM grown cadmium telluride
000B38 (1989) M. Samimi [France] ; B. Biglari [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]Structural defects in high resistivity cadmium telluride
000C01 (1988) B. Biglari [France] ; M. Samimi [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]Effects of copper in high resistivity cadmium telluride
000C49 (1987) B. Biglari [France] ; M. Samimi [France] ; M. Hage-Ali [France] ; P. Siffert [France]Passivation of high-resistivity cadmium telluride by hydrogen implantation
000D06 (1985) M. Samimi [France] ; B. Biglari [France] ; M. Hage-Ali [France] ; P. Siffert [France]Investigation of defects in THM grown cadmium telluride after irradiation damaging
000E83 (1980) C. Scharager [France] ; R. Stuck [France] ; P. Siffert [France] ; J. Cailleret [France] ; Ch. Heitz [France] ; G. Lagarde [France] ; D. Tenorio [France]Trace analysis in cadmium telluride by heavy ion induced x-ray emission and by SIMS
000F30 (1979) M. Hage-Ali [France] ; R. Stuck [France] ; AN Saxena [France] ; P. Siffert [France]Studies of CdTe surfaces with secondary ion mass spectrometry, rutherford backscattering and ellipsometry
000F41 (1979) R.O. Bell [États-Unis] ; M. Toulemonde [France] ; P. Siffert [France]Calculated temperature distribution during laser annealing in silicon and cadmium telluride
000F47 (1978) P. Siffert [France] ; B. Rabin [France] ; H.Y. Tabatabai [France] ; R. Stuck [France]Extension of the depletion layer in cadmium telluride nuclear radiation detectors
000F50 (1978) P. Siffert [France]Current possibilities and limitations of cadmium telluride detectors
000F98 (1976) R. Stuck [France] ; A. Cornet [France] ; C. Scharager [France] ; P. Siffert [France]Defects in pure and halogen compensated cadmium telluride grown by the THM method
001023 (1974) P. Siffert [France] ; J.P. Gonidec [France] ; A. Cornet [France] ; R.O. Bell [États-Unis] ; F.V. Wald [États-Unis]Full-energy peak efficiency of cadmium-telluride gamma-ray spectrometers
001031 (1973) M. Hage-ali [France] ; I.V. Mitchell [France] ; J.J. Grob [France] ; P. Siffert [France]Heavy element diffusion in cadmium telluride
001057 (1970) A. Cornet [France] ; P. Siffert [France] ; A. Coche [France]Improvements in the purification of cadmium telluride by zone refining

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